DocumentCode :
1253265
Title :
Author :
Tsai, Tsung-Ying ; Chang, Shoou-Jinn ; Weng, Wen-Yin ; Wang, Sin-Hui ; Chiu, Chiu-Jung ; Hsu, Cheng-Liang ; Hsueh, Ting-Jen
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
24
Issue :
18
fYear :
2012
Firstpage :
1584
Lastpage :
1586
Abstract :
The authors present the fabrication of a TiO2 nanowire ultraviolet (UV) photodetector (PD) with Iridium Schottky contact electrodes. UV-to-visible rejection ratio of the sample is around 107 when biased at 5 V, and the fabricated PD is visible-blind with a sharp cutoff at 390 nm. With an incident light wavelength of 390 nm and an applied bias of 5 V, the measured responsivity of the PD is 9.73 × 10-4 A/W.
Keywords :
Schottky barriers; iridium; nanowires; photodetectors; titanium compounds; ultraviolet detectors; visible spectra; Ir-TiO2; Schottky contact electrodes; UV-to-visible rejection ratio; incident light wavelength; iridium Schottky contacts; nanowires; ultraviolet photodetector; voltage 5 V; wavelength 390 nm; Electrodes; Metals; Nanowires; Photoconductivity; Photodetectors; Schottky barriers; Semiconductor device measurement; ${rm TiO}_{2}$ ; Iridium (Ir); nanowires; photodetector (PC);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2012.2209412
Filename :
6252003
Link To Document :
