• DocumentCode
    12535
  • Title

    Influence of Inner Skin- and Proximity Effects on Conduction in Litz Wires

  • Author

    Rosskopf, Andreas ; Bar, Eberhard ; Joffe, Christopher

  • Author_Institution
    Fraunhofer Inst. for Integrated Syst. & Device Technol., Erlangen, Germany
  • Volume
    29
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    5454
  • Lastpage
    5461
  • Abstract
    For inductive components such as coils, inductors or transformers, litz wires with isolated strands are used to decrease conduction losses in applications with higher operating frequencies. Depending on the inner structure of these wires, the frequency dependent losses differ extremely. Until now simulations have not sufficiently matched experimental measurements. The usual simulation approach has been to assume the initial current values in all strands in the litz wire to be the same. In this paper, a 3-D simulation of the connector allows the determination of the current values depending on the position of the strands in the wire. This current distribution is transferred to a 2-D rotationally symmetric simulation of the system (windings, coils, etc.). The current values are permuted between different strands to simulate the twisting of strands inside the litz wire. With this new method a very good agreement with measured losses was achieved and demonstrates how simulation allows one to improve the performance of litz wires.
  • Keywords
    current distribution; electric connectors; skin effect; wires (electric); 2D rotationally symmetric simulation; 3D simulation; Litz wires; coils; conduction losses; connector; current distribution; frequency dependent losses; inductive components; inductors; inner skin effect; proximity effects; transformers; Coils; Connectors; Current distribution; Loss measurement; Numerical models; Windings; Wires; Litz wire; loss calculation; proximity effect; simulation;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2013.2293847
  • Filename
    6678811