• DocumentCode
    1253896
  • Title

    The design of due date assignment model and the determination of flow time control parameters for the wafer fabrication factories

  • Author

    Chung, Shu-Hsing ; Yang, Ming-Hsien ; Cheng, Cho-Ming

  • Author_Institution
    Dept. of Ind. Eng. & Manage., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    20
  • Issue
    4
  • fYear
    1997
  • fDate
    10/1/1997 12:00:00 AM
  • Firstpage
    278
  • Lastpage
    287
  • Abstract
    High work-in-process (WIP) level, long manufacturing lead time, high lead time variation, and poor due date performance are the major problems for wafer fabrication factories. An order´s due date relates to its releasing time and flow time. Due date performance will not be improved if WIP level is high and material flow is unstable. Too high WIP level cannot increase throughput but lengthens lead time. Find a suitable WIP level and then control the material release by fixed-WIP policy. In this paper, we construct a due date assignment model (DDAM) by using the simulation method and queuing theory. Observing the results of simulations, the lowest system WIP level corresponding to the desired up-time machine utilization rate of the bottleneck resource or the capacity constraint resource (CCR) and the shortest mean flow time can be found. To make the material flow stable, we also propose the methodology of determining a wafer´s WIP level, daily moves, and flow time for each product type and for each circuitry layer; all of these can be used as the parameters for controlling flow time. Demonstration of the DDAM is provided with actual data. Comparing the performance of our DDAM with others, the results reveal that DDAM performs well in each performance criterion
  • Keywords
    digital simulation; integrated circuit manufacture; production control; queueing theory; bottleneck resource; capacity constraint resource; due date assignment model; fixed-WIP policy; flow time control parameters; lead time variation; manufacturing lead time; performance criterion; product type; queuing theory; simulation method; up-time machine utilization rate; wafer fabrication factories; work-in-process level; Circuits; Customer service; Fabrication; Lead; Production facilities; Queueing analysis; Semiconductor device modeling; Stability; Throughput; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4400
  • Type

    jour

  • DOI
    10.1109/3476.650959
  • Filename
    650959