• DocumentCode
    1254035
  • Title

    3-D interconnection for ultra-dense multichip modules

  • Author

    Val, Christian ; Lemoine, Thierry

  • Author_Institution
    Thomson-CSF, Colombes, France
  • Volume
    13
  • Issue
    4
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    814
  • Lastpage
    821
  • Abstract
    A three-dimensional interconnection technology is described that allows a reduction of the occupied area by a factor of 7 or 8 as against 2-D interconnection. The approach consists of interconnecting the bare chips not in the XY plane, but along the Z-axis. The process entails interconnecting the four lateral areas (sides) of the cube formed by stacking n chips (n=8-10) on top of one another. The chips are individually interconnected on a thin film identical to a TAB (tape automatic bonded) film by means of gold wires, prior to cubing. These chips are standard, off-the-shelf, bump-free devices. After passing electrical testing and burn-in, they are then glued on top of one another with the TAB film. After these n chip+film assemblies have been cured (polymerized), a trim operation is carried out to cut the n-chips cube out of the TAB-film carrier cube. The trim line is approximately 100 μm from the edge of the chips. The cube containing the n chips thus provides four lateral areas (sides) in which appear the cross sections of the gold wires connecting each lead of each chip to the corresponding leads on the flexible films. These gold wire cross-sections may be interconnected in two different ways according to the number of chip layouts/outputs or the conductor pitch
  • Keywords
    hybrid integrated circuits; lead bonding; modules; packaging; 3-D interconnection; Au wire lead bonding; MCM; TAB film; Z-axis; bump-free devices; cube packaging; glued on top of one another; of-the-shelf chips; stacking bare chips; three-dimensional interconnection technology; trim operation; ultra-dense multichip modules; vertical interconnection; Assembly; Bonding; Gold; Joining processes; Multichip modules; Polymers; Stacking; Testing; Transistors; Wires;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.62524
  • Filename
    62524