• DocumentCode
    1254040
  • Title

    Finding fault with deep-submicron ICs

  • Author

    Vallett, David P. ; Soden, Jerry M.

  • Author_Institution
    IBM Microelectron. Div., Essex Junction, VT, USA
  • Volume
    34
  • Issue
    10
  • fYear
    1997
  • fDate
    10/1/1997 12:00:00 AM
  • Firstpage
    39
  • Lastpage
    50
  • Abstract
    The ability to isolate and identify subtle defects on complex chips is threatened as semiconductor technology approaches the tenth-micron realm
  • Keywords
    failure analysis; fault diagnosis; integrated circuit testing; deep-submicron IC chip; failure analysis; fault diagnosis; semiconductor technology; Circuit analysis; Circuit faults; Delay; Failure analysis; Integrated circuit interconnections; Laboratories; Logic testing; Packaging; Silicon; Wiring;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/6.625244
  • Filename
    625244
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1254040