DocumentCode
1254675
Title
Wire width planning for interconnect performance optimization
Author
Cong, Jason ; Pan, Zhigang
Author_Institution
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
Volume
21
Issue
3
fYear
2002
fDate
3/1/2002 12:00:00 AM
Firstpage
319
Lastpage
329
Abstract
In this paper, we study wire width planning for interconnect performance optimization in an interconnect-centric design flow. We first propose some simplified, yet near-optimal wire sizing schemes, using only one or two discrete wire widths. Our sensitivity study on wire sizing optimization further suggests that there exists a small set of "globally" optimal wire widths for a range of interconnects. We develop general and efficient methods for computing such a "globally" optimal wire width design and show rather surprisingly that using only two "predesigned" widths for each metal layer, we are still able to achieve close to optimal performance compared with that by using many possible widths, not only for one fixed length, but also for all wire lengths assigned at each metal layer. Our wire width planning can consider different design objectives and wire length distributions. Moreover, our method has a predictable small amount of errors compared with optimal solutions. We expect that our simplified wire sizing schemes and wire width planning methodology will be very useful for better design convergence and simpler routing architectures
Keywords
VLSI; circuit CAD; circuit optimisation; integrated circuit design; integrated circuit interconnections; VLSI; design convergence; interconnect performance optimization; interconnect-centric design flow; metal layer; near-optimal wire sizing; optimal wire width; routing architectures; sizing optimization; wire planning; wire width planning; Capacitance; Circuit optimization; Costs; Delay; Design optimization; Integrated circuit interconnections; Integrated circuit reliability; Routing; Very large scale integration; Wire;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.986425
Filename
986425
Link To Document