Title :
Prediction of analog performance parameters using fast transient testing
Author :
Variyam, Pramodchandran N. ; Cherubal, Sasikumar ; Chatterjee, Abhijit
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fDate :
3/1/2002 12:00:00 AM
Abstract :
In this paper, a fast transient testing methodology for predicting the performance parameters of analog circuits is presented. A transient test signal is applied to the circuit under (cut) test and the transient response of the circuit is sampled and analyzed to predict the circuit´s performance parameters. An algorithm for generating the optimum transient test signal is presented. The methodology is demonstrated in a production environment using a low-power opamp. Result from production test data showed: 1) a ten times speedup in production testing; 2) accurate prediction of the performance parameters; and 3) a simpler test configuration
Keywords :
analogue integrated circuits; fault diagnosis; genetic algorithms; integrated circuit testing; mixed analogue-digital integrated circuits; operational amplifiers; production testing; transient response; analog circuits; analog specification prediction; mixed-signal circuit testing; optimum transient test; performance parameters; production testing; test generation; transient response; Analog circuits; Circuit faults; Circuit testing; Packaging; Performance evaluation; Production; Quality assurance; Stress; Transient analysis; Transient response;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
