DocumentCode :
1254751
Title :
Reliability Test for 500 kV GIS
Author :
Terasaka, Kenichiro ; Aoyagi, H. ; Kamata, I. ; Ohyama, Shohei ; Tanaka, Mitsuru
Author_Institution :
Toshiba Corporation
Issue :
7
fYear :
1982
fDate :
7/1/1982 12:00:00 AM
Firstpage :
65
Lastpage :
66
Keywords :
Cable shielding; Circuit testing; Current measurement; Gas insulation; Geographic Information Systems; Grounding; Sulfur hexafluoride; Surges; Switching circuits; Voltage;
fLanguage :
English
Journal_Title :
Power Engineering Review, IEEE
Publisher :
ieee
ISSN :
0272-1724
Type :
jour
DOI :
10.1109/MPER.1982.5521115
Filename :
5521115
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1254751
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