Title :
Electrode architecture related to surface flashover of solid dielectrics in vacuum
Author_Institution :
Dept. of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA
fDate :
8/1/1997 12:00:00 AM
Abstract :
A lateral test structure with metalized film electrodes is shown to have distinct advantages over a conventional solid electrode structure for studying the HV characteristics of solid insulators in vacuum. The paper presents results of streak photography and spectral analysis of surface discharge luminosity, and of preflashover activity using time-coordinated current, luminosity, and imaging of light activity emanating from the surface of the stressed dielectric. The preflashover activity, consisting of bursts of time-correlated current and light emission, is associated with randomly distributed emission spots on the surface. It is proposed that the above observations are related to charge trapping and detrapping processes at localized energy levels associated with insulator surface defects
Keywords :
electric breakdown; electric charge; electrodes; flashover; insulation testing; insulator testing; spectroscopy; streak photography; surface discharges; test equipment; vacuum breakdown; HV characteristics; charge detrapping processes; charge trapping processes; current bursts; electrode architecture; insulator surface defects; lateral test structure; light emission; localized energy levels; metalized film electrodes; preflashover activity; randomly distributed emission spots; solid dielectrics; solid insulators; spectral analysis; streak photography; surface discharge luminosity; surface flashover; vacuum environment; Dielectrics and electrical insulation; Electrodes; Energy states; Flashover; Insulator testing; Metal-insulator structures; Photography; Solids; Spectral analysis; Surface discharges;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
