DocumentCode :
1255129
Title :
High-index-contrast ridge waveguide laser with thermally oxidised etched facet and metal reflector
Author :
Seibert, C.S. ; Hall, D.C.
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Volume :
46
Issue :
15
fYear :
2010
Firstpage :
1077
Lastpage :
1078
Abstract :
A novel GaAs-based high-index-contrast ridge waveguide quantum well heterostructure laser is demonstrated, which features an etched and wet thermally oxidised rear facet with a deposited metal mirror suitable for wafer scale integration. The self-aligned fabrication process utilises a single deep etch step and oxygen-enhanced non-selective wet oxidation of the AlGaAs heterostructure ridge sidewall and the entire exposed facet, including the waveguide core region composed of low-Al content AlGaAs material not readily oxidised by conventional techniques. Singlemode devices exhibiting thresholds as low as 20 mA at 808 nm are demonstrated.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; quantum well lasers; ridge waveguides; waveguide lasers; AlGaAs; deposited metal mirror; high-index-contrast ridge waveguide laser; metal reflector; quantum well heterostructure laser; thermally oxidised etched facet; wafer scale integration;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2010.1637
Filename :
5521383
Link To Document :
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