Corrosion criteria for electronic packaging. II. Calculated corrosion currents and acceleration factors

Author

Hoge, Carl E.

Author_Institution

Western Digital Corp., Irvine, CA, USA

Volume

13

Issue

4

fYear

1990

fDate

12/1/1990 12:00:00 AM

Firstpage

1098

Lastpage

1104

Abstract

For pt.I see ibid., p.1090-7, Dec. 1990. Numerical values for corrosion currents are calculated for the parameters cited in Part I. A comparison of relative corrosion currents flowing under test and operating conditions is presented. Ratios of these currents are calculated to identify acceleration factors for several ambients. Data reveal that under certain conditions, net deacceleration can result for devices having junction temperatures that are above test condition temperatures. Net accelerations from test to test are shown to be constant as long as the activation energy for the process remains unchanged

Keywords

corrosion; integrated circuit technology; integrated circuit testing; life testing; metallisation; packaging; accelerated testing; acceleration factors; activation energy; corrosion currents; junction temperatures; net deacceleration; test condition temperatures; Acceleration; Atomic layer deposition; Atomic measurements; Corrosion; Electronics packaging; Equations; Kinetic theory; Life estimation; Materials testing; Temperature;

fLanguage

English

Journal_Title

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on

Publisher

ieee

ISSN

0148-6411

Type

jour

DOI

10.1109/33.62554

Filename

62554