Keywords :
VLSI; circuit CAD; integrated circuit testing; multiprocessor interconnection networks; parallel processing; picture processing; CAD workstation; VLSI test; approximate Markov model; automated synthesis; clustered multiprocessor organisation; digital systems; electronic document storage; highly parallel processors; image processing; matrix triangularisation; microprogrammed controllers; military systems; optimising accelerator; partial pivoting; performance evaluation; self-test; systolic architecture;
