Expose yourself to automated test equipment [From the Editor´s Bench]
Author :
Engelberg, Shlomo
Volume :
13
Issue :
4
fYear :
2010
fDate :
8/1/2010 12:00:00 AM
Firstpage :
4
Lastpage :
4
Abstract :
At this time each year, we publish the AUTOTESTCON issue. In this issue, we cover the 45th edition of AUTOTESTCON which was held in Anaheim, California from September 14 ߝ 17, 2009.
