Title :
A knowledge-based system for selecting test methodologies
Author :
Zhu, Xi-An ; Breuer, Melvin A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
A prototype knowledge-based system that helps select test methodologies for a particular type of logic structure is described. The system, called TDES, (testable design expert system), is a subsystem of Adam, an advanced design automation system. The system is being used to test programmable logic arrays, but its architecture is applicable to other types of structures such as RAMs, ROMs, and other combinational logic. It uses a divide-and-conquer (partitioning) strategy and works interactively with a user as an intelligent consultant and assistant.<>
Keywords :
expert systems; logic CAD; logic testing; Adam; TDES; combinational logic; design automation system; divide-and-conquer; knowledge-based system; logic structure; programmable logic arrays; test methodologies; testable design expert system; Automatic testing; Circuit testing; Design automation; Kernel; Knowledge based systems; Logic testing; Programmable logic arrays; System testing; Time division multiplexing; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
