• DocumentCode
    1255537
  • Title

    A knowledge-based system for selecting test methodologies

  • Author

    Zhu, Xi-An ; Breuer, Melvin A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    5
  • Issue
    5
  • fYear
    1988
  • Firstpage
    41
  • Lastpage
    59
  • Abstract
    A prototype knowledge-based system that helps select test methodologies for a particular type of logic structure is described. The system, called TDES, (testable design expert system), is a subsystem of Adam, an advanced design automation system. The system is being used to test programmable logic arrays, but its architecture is applicable to other types of structures such as RAMs, ROMs, and other combinational logic. It uses a divide-and-conquer (partitioning) strategy and works interactively with a user as an intelligent consultant and assistant.<>
  • Keywords
    expert systems; logic CAD; logic testing; Adam; TDES; combinational logic; design automation system; divide-and-conquer; knowledge-based system; logic structure; programmable logic arrays; test methodologies; testable design expert system; Automatic testing; Circuit testing; Design automation; Kernel; Knowledge based systems; Logic testing; Programmable logic arrays; System testing; Time division multiplexing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.7981
  • Filename
    7981