DocumentCode :
1255543
Title :
Implementing serial bus interfaces using general purpose digital instrumentation
Author :
Johnson, Dale
Author_Institution :
Geotest - Marvin Test Systems, Inc.
Volume :
13
Issue :
4
fYear :
2010
fDate :
8/1/2010 12:00:00 AM
Firstpage :
8
Lastpage :
13
Abstract :
While a dedicated test instrument can offer more targeted test capabilities for serial bus interfaces, a solution built around a general-purpose digital test instrument can offer flexibility that is unmatched in a dedicated bus test tool. This includes the flexibility to adapt to multiple bus environments, adapt to changing test conditions, support non-standard protocols (data rates, timing, or message sizes), provide synchronization for external equipment to time-specific bus events, as well as support other static and dynamic digital test needs. A general purpose solution can reduce the footprint of the test system and reduce the test equipment learning curve as the test engineer is working with one instrument or learning one programming language. Supporting multiple serial busses with one general-purpose instrument also means that the test engineer needs to interface with only one vendor should technical support be required. Finally, significant cost savings can be realized as the number of different bus protocols that need to be supported increases, while the hardware investment does not. Ultimately, the goal is to identify those instances where the clever or novel application of a general-purpose digital test tool is appropriate and provides tangible benefits in time, cost flexibility and effective utilization of resources.
Keywords :
peripheral interfaces; programming languages; protocols; system buses; test equipment; bus protocol; dedicated test instrument; general-purpose digital test instrument; nonstandard protocol; programming language; serial bus interface; test equipment learning curve; time-specific bus event; Circuit testing; Cost function; Electronic components; Electronics industry; Instruments; Lab-on-a-chip; Master-slave; Protocols; Registers; Timing;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2010.5521859
Filename :
5521859
Link To Document :
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