DocumentCode :
1255608
Title :
Advanced testing and prognostics of ball grid array components with a stand-alone monitor IC
Author :
Bhatia, Anuj ; Hofmeister, James P. ; Judkins, Justin ; Goodman, Doug
Volume :
13
Issue :
4
fYear :
2010
fDate :
8/1/2010 12:00:00 AM
Firstpage :
42
Lastpage :
47
Abstract :
In this paper, we introduced a new solder-joint fault sensor, SJ Monitor. We gave a brief overview of the mechanics-of-failure, the intermittent behavior of fractured solder bumps, the state-of-the-art in fault detection, details of the SJ Monitor and discussed intermittency mitigation. The primary contributor to fatigue damage of solder joints is thermomechanical stresses. Solder-joint fatigue damage can result in fractures that cause intermittent instances of high-resistance spikes that are hard to diagnose.
Keywords :
ball grid arrays; digital integrated circuits; fault diagnosis; solders; thermomechanical treatment; SJ monitor; ball grid array component; fault detection; high-resistance spike; mechanics of failure; solder bump; solder joint fault sensor; stand-alone monitor IC; thermomechanical stress; Aerospace testing; Application specific integrated circuits; Circuit faults; Condition monitoring; Digital integrated circuits; Electronics packaging; Fault detection; Field programmable gate arrays; Integrated circuit testing; Maintenance;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2010.5521868
Filename :
5521868
Link To Document :
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