• DocumentCode
    1255608
  • Title

    Advanced testing and prognostics of ball grid array components with a stand-alone monitor IC

  • Author

    Bhatia, Anuj ; Hofmeister, James P. ; Judkins, Justin ; Goodman, Doug

  • Volume
    13
  • Issue
    4
  • fYear
    2010
  • fDate
    8/1/2010 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    In this paper, we introduced a new solder-joint fault sensor, SJ Monitor. We gave a brief overview of the mechanics-of-failure, the intermittent behavior of fractured solder bumps, the state-of-the-art in fault detection, details of the SJ Monitor and discussed intermittency mitigation. The primary contributor to fatigue damage of solder joints is thermomechanical stresses. Solder-joint fatigue damage can result in fractures that cause intermittent instances of high-resistance spikes that are hard to diagnose.
  • Keywords
    ball grid arrays; digital integrated circuits; fault diagnosis; solders; thermomechanical treatment; SJ monitor; ball grid array component; fault detection; high-resistance spike; mechanics of failure; solder bump; solder joint fault sensor; stand-alone monitor IC; thermomechanical stress; Aerospace testing; Application specific integrated circuits; Circuit faults; Condition monitoring; Digital integrated circuits; Electronics packaging; Fault detection; Field programmable gate arrays; Integrated circuit testing; Maintenance;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2010.5521868
  • Filename
    5521868