• DocumentCode
    1255635
  • Title

    Photo-induced deposition of low dielectric constant polyimide film for interlayer dielectric applications

  • Author

    Jun-ying Zhang ; Boyd, I.W.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. Coll. London
  • Volume
    33
  • Issue
    10
  • fYear
    1997
  • fDate
    5/8/1997 12:00:00 AM
  • Firstpage
    911
  • Lastpage
    912
  • Abstract
    The photo-assisted conversion of polyamic acid spun onto Si substrates into thin polyimide films at low temperature using a 172 nm excimer lamp is reported. Current-voltage measurements showed that the leakage current densities in the polymer were over an order of magnitude less than those obtained in films prepared by conventional thermal processing
  • Keywords
    dielectric thin films; integrated circuit interconnections; leakage currents; permittivity; polymer films; semiconductor technology; 172 nm; Si; current-voltage measurements; dielectric constant; interlayer dielectric applications; leakage current densities; polyamic acid; polyimide film;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970603
  • Filename
    592656