DESC efforts for parts quality improvement

Author

Robinson, Glenda R. ; McNicholl, Brian P.

Author_Institution

Defense Electron. Supply Center, Dayton, OH, USA

Volume

5

Issue

9

fYear

1990

Firstpage

7

Lastpage

10

Abstract

Some of the impact that the test program at the Defense Electronics Supply Center (DESC) is having on improving the quality of products being supplied to its customers is illustrated. DESC test program non-mil lot rejection rates were nearing 50% for discrete semiconductors tested in receiving inspection. The associated part reject rate was nearly 15%. The part reject rate for all federal supply classes (FSCs) being sampled is less than 1%. Plans to drive the defect rate toward 100 PPM are discussed. Data indicate an increase in the quality of DESC-sampled devices being supplied for the military services over the last few years. The test programs and the sampling and test requirements are described.<>

Keywords

electronic equipment testing; military equipment; military systems; production testing; quality control; test facilities; Defense Electronics Supply Center; discrete semiconductors; electronic equipment testing; military equipment; part reject rate; quality; receiving inspection; sampling; test program; Electronic equipment testing; Inspection; Material storage; Materials testing; Performance evaluation; Power capacitors; Quality management; Semiconductor device testing; Test facilities; US Government;

fLanguage

English

Journal_Title

Aerospace and Electronic Systems Magazine, IEEE

Publisher

ieee

ISSN

0885-8985

Type

jour

DOI

10.1109/62.59278

Filename

59278