DocumentCode :
1255687
Title :
DESC efforts for parts quality improvement
Author :
Robinson, Glenda R. ; McNicholl, Brian P.
Author_Institution :
Defense Electron. Supply Center, Dayton, OH, USA
Volume :
5
Issue :
9
fYear :
1990
Firstpage :
7
Lastpage :
10
Abstract :
Some of the impact that the test program at the Defense Electronics Supply Center (DESC) is having on improving the quality of products being supplied to its customers is illustrated. DESC test program non-mil lot rejection rates were nearing 50% for discrete semiconductors tested in receiving inspection. The associated part reject rate was nearly 15%. The part reject rate for all federal supply classes (FSCs) being sampled is less than 1%. Plans to drive the defect rate toward 100 PPM are discussed. Data indicate an increase in the quality of DESC-sampled devices being supplied for the military services over the last few years. The test programs and the sampling and test requirements are described.<>
Keywords :
electronic equipment testing; military equipment; military systems; production testing; quality control; test facilities; Defense Electronics Supply Center; discrete semiconductors; electronic equipment testing; military equipment; part reject rate; quality; receiving inspection; sampling; test program; Electronic equipment testing; Inspection; Material storage; Materials testing; Performance evaluation; Power capacitors; Quality management; Semiconductor device testing; Test facilities; US Government;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/62.59278
Filename :
59278
Link To Document :
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