Transmission and reflection charts for two-port single impedance networks

Author

Wu, Z.

Author_Institution

Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK

Volume

148

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

351

Lastpage

356

Abstract

The transmission and reflection charts for two-port single series impedance or shunt admittance networks are described. The charts are shown to have a scaling property, which allows the same chart to be used for convenience when the scale of the chart is changed. They can be used as an alternative to the Smith chart for impedance or admittance measurements. If the charts are built into a test instrument, the transmission response can then be used for impedance or admittance measurements. Applications of the charts for the identification of pure resonance in dielectric or cavity resonators, quality factor measurements and the observation of the critical state of superconducting resonators are also presented

Keywords

Q-factor measurement; cavity resonators; dielectric resonators; electric admittance measurement; electric impedance measurement; frequency response; microwave measurement; superconducting resonators; two-port networks; admittance measurements; cavity resonators; dielectric resonators; impedance measurements; pure resonance identification; quality factor measurements; reflection charts; scaling property; shunt admittance networks; superconducting resonators; test instrument; transmission charts; two-port single impedance networks;

fLanguage

English

Journal_Title

Microwaves, Antennas and Propagation, IEE Proceedings

Publisher

iet

ISSN

1350-2417

Type

jour

DOI

10.1049/ip-map:20010797

Filename

986925