• DocumentCode
    1255707
  • Title

    Influence of Package Structure on the Performance of the Single Emitter Diode Laser

  • Author

    Li, Xiaoning ; Zhang, Yanxin ; Wang, Jingwei ; Xiong, Lingling ; Zhang, Pu ; Nie, Zhiqiang ; Wang, Zhenfu ; Liu, Hui ; Liu, Xingsheng

  • Volume
    2
  • Issue
    10
  • fYear
    2012
  • Firstpage
    1592
  • Lastpage
    1599
  • Abstract
    The package structure critically influences the major characteristics of semiconductor lasers, such as thermal behavior, output power, wavelength, and far-field distribution. In this paper, a new single emitter package structure called F-mount is designed and compared with the conventional package structure C-mount. The influence of package structure on their performances is characterized and analyzed. The thermal resistances of lasers with different package structures are calculated through simulation, and are contrasted with experimental results. Some devices are also tested for the maximum output power level. Under the continuous wave (CW) condition, the maximum power of F-mount reaches 12.6 W at 808 nm while the output power only reaches 10.9 W for C-mount. Under the condition of 0.5% duty cycle (100 μs, 50 Hz), the catastrophic optical mirror damage level reaches 58.7 W at 74 A for F-mount, and 54.8 W at 57 A for C-mount are reported for the first time. It is experimentally found that there is an obvious wavelength difference between the two type structure lasers: about 1.37 nm in CW mode and 2.89 nm in quasi CW mode. Theoretical analysis shows that red-shift and blue-shift is a result of external strain in the package process of F-mount and C-mount, respectively. It is also found that the package structure has an effect on the divergence angle of slow axis far fields, but little impact on that of fast axis far fields. The analysis shows that package structure has a strong influence on the performance of the laser; therefore, the package should be optimized to achieve better performance for some special applications.
  • Keywords
    packaging; red shift; semiconductor lasers; thermal resistance; C-mount; F-mount; blue shift; catastrophic optical mirror damage; continuous wave condition; current 57 A; far field distribution; fast axis far fields; package structure; power 10.9 W; power 12.6 W; power 54.8 W; power 58.7 W; red shift; semiconductor lasers; single emitter diode laser; slow axis far fields; thermal behavior; thermal resistance; wavelength 808 nm; Heating; Laser modes; Power generation; Power lasers; Quantum cascade lasers; Thermal resistance; Component architectures; semiconductor device packaging;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2207456
  • Filename
    6255780