DocumentCode :
1255981
Title :
A 40-μA/channel compensated 18-channel strain gauge measurement system for stress monitoring in dental implants
Author :
Claes, Wim ; Sansen, Willy ; Puers, Robert
Author_Institution :
ESAT, Katholieke Univ., Leuven, Heverlee, Belgium
Volume :
37
Issue :
3
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
293
Lastpage :
301
Abstract :
This paper presents an autonomous monitoring system ASIC, which is capable of measuring and compensating 18 strain gauges simultaneously. This sensor interface is implemented in a 0.7-μm CMOS technology and includes a proportional to absolute temperature (PTAT)-current reference, an 8-bit digital-to-analog converter together with a digital interface for multigauge nulling, a switched-capacitor (SC) instrumentation amplifier, an SC sample-and-hold (S/H), and a 9-bit successive approximation analog-to-digital converter. The total chip consumes a mere 40 μA/channel (at 3.1 V) and allows for sampling of each individual strain gauge channel at a sampling rate of 111 Hz with a 20-μstrain accuracy. The measurement system presented is a part of an autonomous data logger, which is integrated in a dental prosthesis
Keywords :
CMOS integrated circuits; application specific integrated circuits; biomedical electronics; biomedical measurement; compensation; data loggers; dentistry; low-power electronics; patient monitoring; prosthetics; strain gauges; stress measurement; 0.7 micron; 111 Hz; 3.1 V; 8 bit; 9 bit; ASIC; CMOS technology; PTAT current reference; SC sample-and-hold circuit; analog-to-digital converter; autonomous data logger; compensation; dental implant; dental prosthesis; digital interface; digital-to-analog converter; low-power sensor interface; multichannel strain gauge measurement system; multigauge nulling; stress monitoring; switched-capacitor instrumentation amplifier; Analog-digital conversion; Application specific integrated circuits; CMOS technology; Capacitive sensors; Digital-analog conversion; Instruments; Monitoring; Sampling methods; Strain measurement; Temperature sensors;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.987080
Filename :
987080
Link To Document :
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