Title :
An integrated RF transceiver for DECT application
Author :
Cosentino, Salvatore ; Filoramo, Pietro ; Granata, Angelo ; Marletta, Marco ; Martino, Giuseppe ; Pelleriti, Roberto ; Torrisi, Felice ; Paparo, Mario ; Cosentino, Gaetano ; Vita, Piero ; Palmisano, Giuseppe
Author_Institution :
STMicroelectronics, Catania, Italy
fDate :
3/1/2002 12:00:00 AM
Abstract :
An integrated circuit (IC) is presented which implements the complete RF front-end solution for a digital enhanced cordless communications (DECT) cordless phone provided that a single-transistor LNA and a power amplifier are included on the application board. Focus has been put in the paper on the image rejection mixer which achieves image rejection mean values of 43 dB and on the fully integrated voltage-controlled oscillators which guarantees -134 dBc phase noise at 6.5-MHz offset over temperature and process variation. The circuit was fabricated in a high-performance low-cost 20-GHz silicon bipolar technology and assembled on a TQFP64 package. It was tested on the complete application board including the LNA and the power amplifier, and it fully complies with the ETSI TBR06 standard requirements. The internal power supply is 2.8 V
Keywords :
bipolar analogue integrated circuits; cordless telephone systems; integrated circuit noise; microwave mixers; phase noise; transceivers; voltage-controlled oscillators; 2.8 V; 20 GHz; DECT application; DECT cordless phone; ETS1 TBR06 standard requirements; RF front-end solution; TQFP64 package; application board; fully integrated voltage-controlled oscillators; image rejection mixer; integrated RF transceiver; internal power supply; phase noise; power amplifier; process variation; silicon bipolar technology; single-transistor LNA; temperature variation; Application specific integrated circuits; Digital integrated circuits; Focusing; Phase noise; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Radiofrequency integrated circuits; Transceivers; Voltage-controlled oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of