Title :
An mK×nK bouwblok CCD image sensor family. I. Design
Author :
Kreider, Greg ; Bosiers, Jan T.
Author_Institution :
Philips Semicond. Image Sensors, Eindhoven, Netherlands
fDate :
3/1/2002 12:00:00 AM
Abstract :
This paper presents a bouwblok family of CCD image sensors, a set of devices of varying size built with a single pixel design from one mask set. It describes the original design goals and how they led to dividing the layout into smaller blocks that could be stitched together to form a complete sensor. The architecture is traditional for large-area scientific devices. The pixel design is optimized for large charge packets, antiblooming and low dark current, the horizontal register for binning, and the output amplifier for fast pixel rates. The paper describes how the design is split and modified to cover all possible configurations and how to minimize the effects of stitching
Keywords :
CCD image sensors; integrated circuit layout; network routing; CCD image sensors; antiblooming; binning; bouwblok family; building block design; clock routing; design layout; fast pixel rates; frame transfer technology; full-frame sensor; horizontal register; large charge packets; large-area scientific devices; low dark current; minimised stitching effects; output amplifier; single pixel design; varying size devices; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Dark current; Design optimization; Frequency conversion; Image sensors; Pixel; Sensor phenomena and characterization; Upper bound;
Journal_Title :
Electron Devices, IEEE Transactions on