• DocumentCode
    1256153
  • Title

    An mK×nK bouwblok CCD image sensor family. I. Design

  • Author

    Kreider, Greg ; Bosiers, Jan T.

  • Author_Institution
    Philips Semicond. Image Sensors, Eindhoven, Netherlands
  • Volume
    49
  • Issue
    3
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    361
  • Lastpage
    369
  • Abstract
    This paper presents a bouwblok family of CCD image sensors, a set of devices of varying size built with a single pixel design from one mask set. It describes the original design goals and how they led to dividing the layout into smaller blocks that could be stitched together to form a complete sensor. The architecture is traditional for large-area scientific devices. The pixel design is optimized for large charge packets, antiblooming and low dark current, the horizontal register for binning, and the output amplifier for fast pixel rates. The paper describes how the design is split and modified to cover all possible configurations and how to minimize the effects of stitching
  • Keywords
    CCD image sensors; integrated circuit layout; network routing; CCD image sensors; antiblooming; binning; bouwblok family; building block design; clock routing; design layout; fast pixel rates; frame transfer technology; full-frame sensor; horizontal register; large charge packets; large-area scientific devices; low dark current; minimised stitching effects; output amplifier; single pixel design; varying size devices; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Dark current; Design optimization; Frequency conversion; Image sensors; Pixel; Sensor phenomena and characterization; Upper bound;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.987104
  • Filename
    987104