Title :
Defect Oriented Testing for Analog/Mixed-Signal Designs
Author :
Kruseman, B. ; Tasic, B. ; Hora, C. ; Dohmen, J. ; Hashempour, H. ; van Beurden, M. ; Xing, Yan
Author_Institution :
NXP Semicond., Eindhoven, Netherlands
Abstract :
In this contribution, the authors describe an application of Defect Oriented Testing (DOT) to commercial mixed-signal designs. A major challenge of DOT application to these designs is the enormous simulation time typically required. The authors address this major challenge with a new algorithm that provides a significant speed-up of over 100x, while at the same time reduces test time by 48% and improves fault coverage by 15%.
Keywords :
integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; analog/mixed signal design; defect oriented testing; new algorithm; Analytical models; Bridge circuits; Circuit faults; Computational modeling; Integrated circuit modeling; US Department of Transportation;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2012.2210852
