Title :
An mK×nK bouwblok CCD image sensor family. II. Characterization
Author :
Kreider, Greg ; Dillen, Bart G M ; Heijns, Henk ; Korthout, Laurens ; Roks, Edwin
Author_Institution :
Cypress Semicond., Nashua, NH, USA
fDate :
3/1/2002 12:00:00 AM
Abstract :
For pt. I see ibid., vol. 49, no. 3, p. 361-69 (2002). This paper characterizes the performance of four sensors from the bouwblok family. The original design meets the key original design goals, including the maximum packet size Qmax, readout speed, antiblooming protection, and optical performance. Three-level vertical clocks are used to reach more than 12-bits linear dynamic range at 60°C, and the binning capacity is limited at the floating diffusion and in the horizontal register. The dark current is low for a modern non-MPP (multiphase pinned) technology (0.3 nA/cm2). The performance of the design is consistent (for identical clocking conditions at the pixel) across all members of the family
Keywords :
CCD image sensors; dark conductivity; integrated circuit noise; optical transfer function; 60 degC; MTF; antiblooming protection; binning capacity; bouwblok CCD image sensor family; dark current; floating diffusion; high dynamic range; horizontal register; image sensor characterization; maximum packet size; optical performance; readout speed; three-level vertical clocks; Charge-coupled image sensors; Chirp modulation; Clocks; Dark current; Dynamic range; Image sensors; Optical design; Pixel; Protection; Sensor phenomena and characterization;
Journal_Title :
Electron Devices, IEEE Transactions on
