Title :
A compact scattering model for the nanoscale double-gate MOSFET
Author :
Rahman, Anisur ; Lundstrom, Mark S.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
3/1/2002 12:00:00 AM
Abstract :
An analytically compact model for the nanoscale double gate metal-oxide semiconductor field effect transistor (MOSFET) based on McKelvey´s flux theory is developed. The model is continuous above and below threshold and from the linear to saturation regions. Most importantly, it describes nanoscale MOSFETs from the diffusive to ballistic regimes. In addition to its use in exploring the limits and circuit applications of double gate MOSFETs, the model also serves as an example of how semiclassical scattering theory can be used to develop physically sound models for nanoscale transistors
Keywords :
MOSFET; carrier mean free path; carrier mobility; hot carriers; semiconductor device models; ballistic regimes; carrier mobility; charge carrier processes; compact scattering model; degeneracy; device simulation; diffusive regimes; flux theory; hot electrons; mean free path; nanoscale double gate MOSFET; nanoscale transistors; nondegenerate carrier statistics; quantum effects; semiclassical approach; Acoustic scattering; Circuit simulation; Displays; Double-gate FETs; Helium; MOS devices; MOSFET circuits; Particle scattering; Physics; Semiconductor device modeling;
Journal_Title :
Electron Devices, IEEE Transactions on