• DocumentCode
    1256391
  • Title

    Repetition-frequency tuning of monolithic passively mode-locked semiconductor lasers with integrated extended cavities

  • Author

    Arahira, Shin ; Ogawa, Yoh

  • Author_Institution
    Semicond. Technol. Lab., Oki Electr. Ind. Co. Ltd., Tokyo, Japan
  • Volume
    33
  • Issue
    2
  • fYear
    1997
  • fDate
    2/1/1997 12:00:00 AM
  • Firstpage
    255
  • Lastpage
    264
  • Abstract
    Repetition-frequency tuning characteristics of passively mode-locked laser diodes (LDs) were investigated in detail. Anomalous tuning characteristics were observed when the bias conditions of the LDs were changed. Theoretical analysis using conventional self-consistent mode-locking theory showed that the anomaly originated from the change of the detuning from the cavity´s round-trip frequency due to gain/absorption saturation effects in the passively mode-locked lasers. A wide tuning range of 280 MHz (1.6% of the repetition frequency) was obtained by changing the bias conditions of the extended cavity
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; integrated optics; laser cavity resonators; laser mode locking; laser tuning; optical fabrication; optical saturable absorption; quantum well lasers; vapour phase epitaxial growth; 280 MHz; InGaAs-InGaAsP; MOVPE fabrication; absorption saturation effects; anomalous tuning characteristics; bias conditions; detuning; extended cavity; gain effects; integrated extended cavities; monolithic passively mode-locked semiconductor lasers; multiple-quantum well structure; passively mode-locked lasers; repetition-frequency tuning; round-trip frequency; self-consistent mode-locking theory; tuning characteristics; tuning range; Diode lasers; Frequency; Laser mode locking; Laser theory; Laser tuning; Optical pulses; Optical tuning; Optical waveguides; Semiconductor lasers; Timing jitter;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.552266
  • Filename
    552266