Title :
1.25 V Supply 0.72 V Output Voltage Swing Two-Step Readout CMOS Active Pixel Architecture
Author :
Tsai, Tsung-Hsun ; Hornsey, Richard
Author_Institution :
Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
Abstract :
A large voltage swing active pixel structure for complementary metal-oxide-semiconductor (CMOS) image sensors is presented. The sensor has a 1.5 × 1.5 mm die area, and it is fabricated by using 0.13 μm 1P8M digital CMOS technology. The pixel size is 5 × 5 μm . It has a two-step readout and 0.72 V output voltage swing with a power supply of 1.25 V. Three different photodetectors, including n-well/p-sub, n+/p-sub, and photogate, are implemented in a 32 × 92 array and tested. A maximum 61 dB dynamic range is measured from the photogate pixel, and the signal-to-noise ratio is 53 dB. The measured root-mean-square temporal noise is below 0.6% for three different pixel arrays. A ring oscillator readout circuit is also implemented to generate a frequency output according to pixel signal. A digital counter is used to further record the frequency signal, therefore an extra analog-to-digital converter is not required.
Keywords :
CMOS analogue integrated circuits; CMOS image sensors; oscillators; photodetectors; readout electronics; 1P8M digital CMOS technology; complementary metal-oxide-semiconductor image sensor; digital counter; extra analog-to-digital converter; gain 53 dB; n-well-p-sub; n+-p-sub; output voltage swing two-step readout CMOS active pixel architecture; photodetectors; photogate pixel; ring oscillator readout circuit; root-mean-square temporal noise measurement; signal-to-noise ratio; size 0.13 mum; voltage 0.72 V; voltage 1.25 V; Photodiodes; Signal to noise ratio; Transfer functions; Transistors; Active pixel sensor; complementary metal- oxide-semiconductor (CMOS) image sensor; photodiode; photogate; signal-to-noise ratio (SNR); two-step readout;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2012.2211009