• DocumentCode
    1256416
  • Title

    Maximum likelihood analysis of component reliability using masked system life-test data

  • Author

    Usher, John S. ; Hodgson, Thom J.

  • Author_Institution
    Dept. of Ind. Eng., Louisvill Univ., KY, USA
  • Volume
    37
  • Issue
    5
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    550
  • Lastpage
    555
  • Abstract
    Life data from multicomponent systems are often analyzed to estimate the reliability of each system component. Due to the cost and diagnostic constraints, however, the exact cause of system failure might be unknown. Referring to such situations as being masked, the authors use a likelihood approach to exploit all the available information. They focus on a series system of three components, each with a constant failure rate, and propose a single numerical procedure for obtaining maximum-likelihood estimations (MLEs) in the general case. It is shown that, under certain assumptions, closed-form solutions for the MLEs can be obtained. The authors consider that the cause of system failure can be isolated to some subset of components, which allows them to consider the full range of possible information on the cause of system failure. The likelihood, while presented for complete data, can be extended to censoring. The general likelihood expressions can be used with various component life distributions, e.g., Weibull, lognormal. However, closed-form MLEs would most certainly be intractable and numerical methods would be required
  • Keywords
    failure analysis; life testing; parameter estimation; reliability theory; component reliability; masked system life-test data; maximum likelihood estimation; series system; system failure; Assembly systems; Closed-form solution; Costs; Failure analysis; Life estimation; Life testing; Maximum likelihood estimation; State estimation; Statistical analysis; System testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.9880
  • Filename
    9880