DocumentCode
1256416
Title
Maximum likelihood analysis of component reliability using masked system life-test data
Author
Usher, John S. ; Hodgson, Thom J.
Author_Institution
Dept. of Ind. Eng., Louisvill Univ., KY, USA
Volume
37
Issue
5
fYear
1988
fDate
12/1/1988 12:00:00 AM
Firstpage
550
Lastpage
555
Abstract
Life data from multicomponent systems are often analyzed to estimate the reliability of each system component. Due to the cost and diagnostic constraints, however, the exact cause of system failure might be unknown. Referring to such situations as being masked, the authors use a likelihood approach to exploit all the available information. They focus on a series system of three components, each with a constant failure rate, and propose a single numerical procedure for obtaining maximum-likelihood estimations (MLEs) in the general case. It is shown that, under certain assumptions, closed-form solutions for the MLEs can be obtained. The authors consider that the cause of system failure can be isolated to some subset of components, which allows them to consider the full range of possible information on the cause of system failure. The likelihood, while presented for complete data, can be extended to censoring. The general likelihood expressions can be used with various component life distributions, e.g., Weibull, lognormal. However, closed-form MLEs would most certainly be intractable and numerical methods would be required
Keywords
failure analysis; life testing; parameter estimation; reliability theory; component reliability; masked system life-test data; maximum likelihood estimation; series system; system failure; Assembly systems; Closed-form solution; Costs; Failure analysis; Life estimation; Life testing; Maximum likelihood estimation; State estimation; Statistical analysis; System testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.9880
Filename
9880
Link To Document