DocumentCode :
1256475
Title :
Sensitivity analysis of Jaumann absorbers
Author :
Charles, A. ; Towers, M.S. ; McCowen, A.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Wales, Swansea, UK
Volume :
146
Issue :
4
fYear :
1999
fDate :
8/1/1999 12:00:00 AM
Firstpage :
257
Lastpage :
262
Abstract :
Jaumann absorbers show promise as radar absorbing materials (RAMs) for suppressing scattering reflections or reducing the radar cross-section (RCS) of perfectly conducting scatterers. Although various optimised designs are reported in the literature, there is little information on sensitivity of performance to manufacturing errors in the spacers and sheet resistances. The paper reports the findings of some studies using Taguchi methods to evaluate sensitivity and interactions of parameters in Jaumann layers placed on plane and curved (cylindrical) surfaces. The results are favourable, indicating moderate sensitivities to individual parameters and the only strong interactions present between the interlayer spacings
Keywords :
electric resistance; electromagnetic wave absorption; electromagnetic wave scattering; radar cross-sections; sensitivity analysis; EMC; Jaumann absorbers; Jaumann layers; RCS reduction; cylindrical surface; interlayer spacings; manufacturing errors; optimised designs; perfectly conducting scatterers; plane surface; radar absorbing materials; radar cross-section; scattering reflections suppression; sensitivity analysis; sheet resistances; spacers;
fLanguage :
English
Journal_Title :
Microwaves, Antennas and Propagation, IEE Proceedings
Publisher :
iet
ISSN :
1350-2417
Type :
jour
DOI :
10.1049/ip-map:19990566
Filename :
799051
Link To Document :
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