DocumentCode
1257305
Title
Timing characteristics of a Cd1-xZnxTe detector-based X-ray imaging system
Author
Giakos, George C. ; Vedantham, S. ; Chowdhury, S. ; Odogba, J. ; Dasgupta, A. ; Guntupalli, R. ; Suryanarayanan, S. ; Vega-Lozada, V. ; Sridhar, M. ; Khyati, M. ; Shah, N.
Author_Institution
Dept. of Biomed. Eng., Akron Univ., OH, USA
Volume
48
Issue
5
fYear
1999
fDate
10/1/1999 12:00:00 AM
Firstpage
909
Lastpage
914
Abstract
The timing characteristics of a planar Cd1-xZnx Te sample at each frequency of a scanning square-wave test pattern, has been measured. This study is aimed at evaluating the speed characteristics of a Cd1-xZnxTe detector for X-ray imaging and computed tomographic (CT) applications. The experimental results of this study indicate that the temporal response of a Cd1-xZnxTe detector based X-ray system, improves significantly by optimizing the X-ray tube and detector parameters
Keywords
II-VI semiconductors; X-ray detection; biomedical equipment; cadmium compounds; computerised tomography; diagnostic radiography; image sensors; optical transfer function; semiconductor counters; zinc compounds; Cd1-xZnxTe detector-based; CdZnTe; X-ray imaging system; computed tomographic applications; digital radiography; optimized X-ray tube parameters; optimized detector parameters; scanning square-wave test pattern; temporal response; timing MTF; timing characteristics; Computer applications; Frequency measurement; Tellurium; Testing; Timing; Tomography; X-ray detection; X-ray detectors; X-ray imaging; Zinc;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.799646
Filename
799646
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