• DocumentCode
    1257830
  • Title

    Microstructural evolution during thermomechanical fatigue of 62Sn-36Pb-2Ag and 60Sn-40Pb solder joints

  • Author

    Frear, Darrel R.

  • Author_Institution
    Sandia Nat. Lab., Albuquerque, NM, USA
  • Volume
    13
  • Issue
    4
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    718
  • Lastpage
    726
  • Abstract
    An initial study was performed to examine the effect of adding a small amount of silver on the thermomechanical fatigue behavior of near-eutectic Sn-Pb solders. The solder studies were 60Sn-40Pb and 62Sn-36Pb-2Ag. For both solders, as the strain rate decreased the lifetime increased, because the dislocation substructure anneals more rapidly than it work-hardens, which tends to minimize subsequent heterogeneous recrystallization and growth. The addition of silver resulted in the formation of large Ag3Sn intermetallic whiskers in the solder joints. The whiskers were too large to be benefactors in thermomechanical fatigue, but neither were they so brittle as to decrease the fatigue life. From a microstructural viewpoint, it does not appear that the addition of silver has any significant effect on the thermomechanical fatigue behavior
  • Keywords
    dislocation structure; fatigue testing; lead alloys; life testing; silver alloys; soldering; tin alloys; whiskers (crystal); Ag3Sn intermetallic whiskers; SnPbAg solder joints; dislocation substructure annealing; fatigue life; heterogeneous recrystallization; lifetime; microstructural evolution; near eutectic SnPb solder joints; strain rate; thermomechanical fatigue; Capacitive sensors; Conductive films; Conductors; Fatigue; Intermetallic; Leaching; Silver; Soldering; Thermomechanical processes; Thick films;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.62585
  • Filename
    62585