• DocumentCode
    1257916
  • Title

    Particle-in-cell plus direct simulation Monte Carlo (PIC-DSMC) approach for self-consistent plasma-gas simulations

  • Author

    Serikov, Vladimir V. ; Kawamoto, Shinji ; Nanbu, Kenichi

  • Author_Institution
    Nippon Sheet Glass Co. Ltd., Chiba, Japan
  • Volume
    27
  • Issue
    5
  • fYear
    1999
  • fDate
    10/1/1999 12:00:00 AM
  • Firstpage
    1389
  • Lastpage
    1398
  • Abstract
    The particle-in-cell (PIC) and direct simulation Monte Carlo (DSMC) approaches have been combined into a PIC-DSMC model for self-consistent simulations of low-temperature collisional plasmas and the background gas. This novel approach is based on the weighting collision simulation scheme allowing for disparate number densities and time scales of different species. The applicability of the developed algorithm is illustrated by simulations of one-dimensional direct current and two-dimensional magnetron sputtering discharges in argon. An appreciable effect of the energetic discharge species on the density, temperature, and flow field of the background gas shows the importance of the coupled plasma-gas simulation for such technologies as sputtering, dry etching, plasma enhanced vapor deposition, etc
  • Keywords
    Monte Carlo methods; plasma CVD; plasma materials processing; plasma simulation; plasma-wall interactions; sputter etching; sputtering; Ar; algorithm; background gas; density; disparate number densities; dry etching; flow field; low-temperature collisional plasmas; one-dimensional direct current; particle-in-cell plus direct simulation Monte Carlo approach; plasma enhanced vapor deposition; self-consistent plasma-gas simulations; sputtering; temperature; two-dimensional magnetron sputtering discharges; weighting collision simulation scheme; Argon; Chemical vapor deposition; Monte Carlo methods; Plasma applications; Plasma density; Plasma materials processing; Plasma properties; Plasma simulation; Plasma temperature; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.799817
  • Filename
    799817