DocumentCode
1258153
Title
A Novel Algorithm for View and Illumination Invariant Image Matching
Author
Yu, Yinan ; Huang, Kaiqi ; Chen, Wei ; Tan, Tieniu
Author_Institution
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Volume
21
Issue
1
fYear
2012
Firstpage
229
Lastpage
240
Abstract
The challenges in local-feature-based image matching are variations of view and illumination. Many methods have been recently proposed to address these problems by using invariant feature detectors and distinctive descriptors. However, the matching performance is still unstable and inaccurate, particularly when large variation in view or illumination occurs. In this paper, we propose a view and illumination invariant image-matching method. We iteratively estimate the relationship of the relative view and illumination of the images, transform the view of one image to the other, and normalize their illumination for accurate matching. Our method does not aim to increase the invariance of the detector but to improve the accuracy, stability, and reliability of the matching results. The performance of matching is significantly improved and is not affected by the changes of view and illumination in a valid range. The proposed method would fail when the initial view and illumination method fails, which gives us a new sight to evaluate the traditional detectors. We propose two novel indicators for detector evaluation, namely, valid angle and valid illumination, which reflect the maximum allowable change in view and illumination, respectively. Extensive experimental results show that our method improves the traditional detector significantly, even in large variations, and the two indicators are much more distinctive.
Keywords
image matching; iterative methods; lighting; reliability; distinctive descriptors; illumination variations; invariant feature detectors; invariant image matching; iterative estimation; local feature; reliability; stability; Detectors; Estimation; Feature extraction; Histograms; Image matching; Lighting; Transforms; Feature detector evaluation; image matching; valid angle (VA); valid illumination (VI); Algorithms; Image Enhancement; Image Interpretation, Computer-Assisted; Lighting; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Journal_Title
Image Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7149
Type
jour
DOI
10.1109/TIP.2011.2160271
Filename
5930364
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