Title :
Analysis of class separation and combination of class-dependent features for handwriting recognition
Author :
Oh, Il-Seok ; Lee, Jin-Seon ; Suen, Ching Y.
Author_Institution :
Dept. of Comput. Sci., Chonbuk Nat. Univ., Chonju, South Korea
fDate :
10/1/1999 12:00:00 AM
Abstract :
In this paper, we propose a new approach to combine multiple features in handwriting recognition based on two ideas: feature selection-based combination and class dependent features. A nonparametric method is used for feature evaluation, and the first part of this paper is devoted to the evaluation of features in terms of their class separation and recognition capabilities. In the second part, multiple feature vectors are combined to produce a new feature vector. Based on the fact that a feature has different discriminating powers for different classes, a new scheme of selecting and combining class-dependent features is proposed. In this scheme, a class is considered to have its own optimal feature vector for discriminating itself from the other classes. Using an architecture of modular neural networks as the classifier, a series of experiments were conducted on unconstrained handwritten numerals. The results indicate that the selected features are effective in separating pattern classes and the new feature vector derived from a combination of two types of such features further improves the recognition rate
Keywords :
feature extraction; handwriting recognition; image classification; neural nets; optimisation; class recognition capabilities; class separation; class-dependent feature combination; class-dependent features; discriminating powers; feature evaluation; handwriting recognition; modular neural network architecture; multiple feature vectors; multiple features; nonparametric method; optimal feature vector; unconstrained handwritten numerals; Handwriting recognition; Humans; Neural networks; Pattern recognition; Performance analysis; Shape; Spatial databases; Standards development; Testing;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on