DocumentCode :
125865
Title :
Experiments of device failures in a planar nine-way metamaterial power-combined amplifier
Author :
Wei-Chiang Lee ; Tah-Hsiung Chu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2014
fDate :
16-23 Aug. 2014
Firstpage :
1
Lastpage :
4
Abstract :
The degradation characteristic of a planar nine-way metamaterial power-combined amplifier with device failures is investigated in this paper. The power-divider/combiner design is based on the metamaterial lens structure and is composed of positive refractive index material and zero refractive index (ZRI) material. Nine 1-W power amplifiers are inserted in the ZRI material to attain a nine-way power-combined amplifier. Due to its uniform isolation characteristics of the metamaterial power divider/combiner, the graceful degradation performance of this power-combined amplifier is shown to be independent of the amplifier failure sequence and is experimentally demonstrated.
Keywords :
metamaterials; power amplifiers; power dividers; ZRI material; device failures; graceful degradation performance; metamaterial lens structure; planar nine-way metamaterial power-combined amplifier; positive refractive index material; power-divider-combiner design; zero refractive index material; Degradation; Metamaterials; Power amplifiers; Power dividers; Power generation; Refractive index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
General Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI
Conference_Location :
Beijing
Type :
conf
DOI :
10.1109/URSIGASS.2014.6929230
Filename :
6929230
Link To Document :
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