• DocumentCode
    125865
  • Title

    Experiments of device failures in a planar nine-way metamaterial power-combined amplifier

  • Author

    Wei-Chiang Lee ; Tah-Hsiung Chu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2014
  • fDate
    16-23 Aug. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The degradation characteristic of a planar nine-way metamaterial power-combined amplifier with device failures is investigated in this paper. The power-divider/combiner design is based on the metamaterial lens structure and is composed of positive refractive index material and zero refractive index (ZRI) material. Nine 1-W power amplifiers are inserted in the ZRI material to attain a nine-way power-combined amplifier. Due to its uniform isolation characteristics of the metamaterial power divider/combiner, the graceful degradation performance of this power-combined amplifier is shown to be independent of the amplifier failure sequence and is experimentally demonstrated.
  • Keywords
    metamaterials; power amplifiers; power dividers; ZRI material; device failures; graceful degradation performance; metamaterial lens structure; planar nine-way metamaterial power-combined amplifier; positive refractive index material; power-divider-combiner design; zero refractive index material; Degradation; Metamaterials; Power amplifiers; Power dividers; Power generation; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    General Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI
  • Conference_Location
    Beijing
  • Type

    conf

  • DOI
    10.1109/URSIGASS.2014.6929230
  • Filename
    6929230