Title :
Electrical properties analysis of micro and nano composite epoxy resin materials
Author :
Castellon, J. ; Nguyen, H.N. ; Agnel, S. ; Toureille, A. ; Fréchette, M. ; Savoie, S. ; Krivda, A. ; Schmidt, L.E.
Author_Institution :
Inst. d´´Electron. du Sud, Univ. Montpellier 2, Montpellier, France
fDate :
6/1/2011 12:00:00 AM
Abstract :
This work deals with the study of micro and nanosilica filled epoxy resin samples carried out in the framework of CIGRE WG D1.24 cooperative test program. This program focused on chemical, electrical and electrostatic properties of epoxy based nanodielectrics for electrical engineering applications. Epoxy based samples filled with micro and/or nanoparticles of silica were characterized by transmission electron microscopy, dielectric spectroscopy, conduction current and space charge measurements. These mutually complementary techniques were used to examine the effect of the size and quantity of silica particles on the electrical properties of the analyzed materials. The analysis of charge injection, polarization, trapping and conduction phenomena has allowed the modeling of dielectric behavior of the studied materials under multiple stresses. The Schottky Injection and Space Charge Limited Current models were studied to explain conduction phenomena. A composition of micro and nano-sized silica particles accumulating the smallest amount of space charge is also proposed.
Keywords :
charge injection; composite insulating materials; epoxy insulation; filled polymers; nanocomposites; nanoparticles; resins; space charge; space-charge-limited conduction; transmission electron microscopy; Schottky injection; charge injection; chemical properties; conduction current; dielectric spectroscopy; electrical properties; electrostatic properties; micro composite epoxy resin materials; micro filled epoxy resin; nano composite epoxy resin materials; nanodielectrics; nanoparticles; nanosilica filled epoxy resin; polarization; space charge limited current models; space charge measurements; transmission electron microscopy; trapping; Charge measurement; Current measurement; Electric fields; Materials; Permittivity; Silicon compounds; Space charge; Nanodielectrics; Transmission Electron Microscopy; conduction current; dielectric; electric field; space charge; spectroscopy;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2011.5931049