DocumentCode :
1258780
Title :
Modeling of optical low coherence reflectometry recorded Bragg reflectograms: evidence to a decisive role of Bragg spectral selectivity
Author :
Gottesman, Y. ; Rao, E.V.K. ; Sillard, H. ; Jacquet, J.
Author_Institution :
Opto+-GIE, Marcoussis, France
Volume :
20
Issue :
3
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
489
Lastpage :
493
Abstract :
This paper draws attention to the basic principles governing reflections in uniform Bragg reflectors (BR) when measured employing optical low coherence reflectometry (OLCR) technique. Using computations based on transfer matrix method (TMM), we first showed a strong spectral dependence of Bragg reflectograms on an OLCR probe spectrum. Later, this dependence is exploited to evaluate, for the first time, the coupling coefficient κ of a Bragg grating in a distributed Bragg reflector (DBR) laser on InP
Keywords :
Bragg gratings; III-V semiconductors; Michelson interferometers; distributed Bragg reflector lasers; indium compounds; integrated optics; light interferometry; optical testing; reflectometry; semiconductor lasers; Bragg grating; Bragg reflectograms; Bragg spectral selectivity; InP; OLCR probe spectrum; coupling coefficient; distributed Bragg reflector laser; optical low coherence reflectometry; strong spectral dependence; transfer matrix method; Coherence; Distortion measurement; Distributed Bragg reflectors; Indium phosphide; Optical interferometry; Optical recording; Optical reflection; Probes; Reflectometry; Research and development;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.988998
Filename :
988998
Link To Document :
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