Modeling of optical low coherence reflectometry recorded Bragg reflectograms: evidence to a decisive role of Bragg spectral selectivity

Author

Gottesman, Y. ; Rao, E.V.K. ; Sillard, H. ; Jacquet, J.

Author_Institution

Opto+-GIE, Marcoussis, France

Volume

20

Issue

3

fYear

2002

fDate

3/1/2002 12:00:00 AM

Firstpage

489

Lastpage

493

Abstract

This paper draws attention to the basic principles governing reflections in uniform Bragg reflectors (BR) when measured employing optical low coherence reflectometry (OLCR) technique. Using computations based on transfer matrix method (TMM), we first showed a strong spectral dependence of Bragg reflectograms on an OLCR probe spectrum. Later, this dependence is exploited to evaluate, for the first time, the coupling coefficient κ of a Bragg grating in a distributed Bragg reflector (DBR) laser on InP

Keywords

Bragg gratings; III-V semiconductors; Michelson interferometers; distributed Bragg reflector lasers; indium compounds; integrated optics; light interferometry; optical testing; reflectometry; semiconductor lasers; Bragg grating; Bragg reflectograms; Bragg spectral selectivity; InP; OLCR probe spectrum; coupling coefficient; distributed Bragg reflector laser; optical low coherence reflectometry; strong spectral dependence; transfer matrix method; Coherence; Distortion measurement; Distributed Bragg reflectors; Indium phosphide; Optical interferometry; Optical recording; Optical reflection; Probes; Reflectometry; Research and development;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.988998

Filename

988998