Title :
Detailed analysis of the intracavity phenomena inside a cylindrical microresonator
Author :
Klunder, D.J.W. ; Balistreri, M.L.M. ; Blom, F.C. ; Hoekstra, H.J.W.M. ; Driessen, A. ; Kuipers, L. ; van Hulst, N.F.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
fDate :
3/1/2002 12:00:00 AM
Abstract :
Based on a rigorous analysis of the intensity distribution inside a cylindrical microresonator (MR), a detailed description of the wavelength and spatial dependence of the intracavity intensity is given. The theory is in accordance with photon scanning tunneling microscopy (PSTM) of an integrated optics MR. Good agreement between the theory and the PSTM measurements is found
Keywords :
micro-optics; optical microscopy; scanning tunnelling microscopy; PSTM measurements; cylindrical microresonator; integrated optics; intensity distribution; intracavity intensity; intracavity phenomena; photon scanning tunneling microscopy; rigorous analysis; spatial dependence; wavelength dependence; Diffraction; Integrated optics; Microcavities; Microscopy; Optical scattering; Optical waveguides; Physics; Power measurement; Tunneling; Wavelength measurement;
Journal_Title :
Lightwave Technology, Journal of
