• DocumentCode
    1258831
  • Title

    Detailed analysis of the intracavity phenomena inside a cylindrical microresonator

  • Author

    Klunder, D.J.W. ; Balistreri, M.L.M. ; Blom, F.C. ; Hoekstra, H.J.W.M. ; Driessen, A. ; Kuipers, L. ; van Hulst, N.F.

  • Author_Institution
    MESA Res. Inst., Twente Univ., Enschede, Netherlands
  • Volume
    20
  • Issue
    3
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    519
  • Lastpage
    529
  • Abstract
    Based on a rigorous analysis of the intensity distribution inside a cylindrical microresonator (MR), a detailed description of the wavelength and spatial dependence of the intracavity intensity is given. The theory is in accordance with photon scanning tunneling microscopy (PSTM) of an integrated optics MR. Good agreement between the theory and the PSTM measurements is found
  • Keywords
    micro-optics; optical microscopy; scanning tunnelling microscopy; PSTM measurements; cylindrical microresonator; integrated optics; intensity distribution; intracavity intensity; intracavity phenomena; photon scanning tunneling microscopy; rigorous analysis; spatial dependence; wavelength dependence; Diffraction; Integrated optics; Microcavities; Microscopy; Optical scattering; Optical waveguides; Physics; Power measurement; Tunneling; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.989003
  • Filename
    989003