• DocumentCode
    1259236
  • Title

    Breakdown voltages in ceramic capacitors with cracks

  • Author

    Teverovsky, Alexander

  • Author_Institution
    Dell Services Fed. Gov., Inc., NASA/GSFC, Greenbelt, MD, USA
  • Volume
    19
  • Issue
    4
  • fYear
    2012
  • fDate
    8/1/2012 12:00:00 AM
  • Firstpage
    1448
  • Lastpage
    1455
  • Abstract
    Breakdown voltages in 27 types of virgin and fractured X7R multilayer ceramic capacitors (MLCC) rated to voltages from 6.3 to 100 V have been measured and analyzed to evaluate the effectiveness of the dielectric withstanding voltage (DWV) testing to screen-out defective parts and get more insight into breakdown specifics of MLCCs with cracks. Fractures in the parts were introduced mechanically and by thermal shock stress. To simulate exposure of internal electrodes to environments in fractured parts, breakdown testing was carried out also on cross-sectioned and polished capacitors.
  • Keywords
    ceramic capacitors; cracks; electric breakdown; fracture; breakdown voltage; ceramic cracking; cross sectioned capacitor; dielectric withstanding voltage; fractured X7R multilayer ceramic capacitor; internal electrode; polished capacitor; voltage 6.3 V to 100 V; Breakdown voltage; Capacitors; Ceramics; Electric breakdown; Electrodes; Testing; Electric breakdown; ceramic capacitors; defects; reliability;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2012.6260022
  • Filename
    6260022