In-situ investigation of patterned magnetic domain structures using magnetic force microscope

Author

Wu, Te-Ho ; Huang, H.W. ; Huang, Y.W. ; Te-Ho Wu

Author_Institution

Dept. of Phys., Nat. Changhua Univ. of Educ., Taiwan

Volume

35

Issue

5

fYear

1999

fDate

9/1/1999 12:00:00 AM

Firstpage

3481

Lastpage

3483

Abstract

A novel method for in-situ investigation of patterned magnetic domain structures is presented. Micron-length scales of permalloy thin film fabricated by a lift-off process using electron beam lithography were placed on the top and adjacent to an aluminum strip. A magnetic force microscope was used to take continuous images of the patterned permalloy films while an electrical current was applied in the aluminum strip, with which a magnetic field was established through the patterned permalloy films in the perpendicular and plane direction. As a result, changes of the magnetic domain structures were observed in the presence of the applied magnetic field

Keywords

Permalloy; electron beam lithography; ferromagnetic materials; magnetic domains; magnetic force microscopy; magnetic thin films; FeNi; Permalloy thin film; aluminum strip; applied magnetic field; electrical current; electron beam lithography; in-situ investigation; lift-off process; magnetic force microscope; micron-length scales; patterned magnetic domain structures; Aluminum; Electron beams; Lithography; Magnetic domains; Magnetic fields; Magnetic films; Magnetic force microscopy; Magnetic forces; Strips; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.800564

Filename

800564