Title :
Accurate Simulation of the Radiation Performance of a Mobile Slide Phone in a Hand-Head Position
Author :
Yu, Wei ; Yang, Shiwen ; Tang, Chia-Lun ; Tu, Danny
Author_Institution :
Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
fDate :
4/1/2010 12:00:00 AM
Abstract :
An accurate simulation of the radiation performance of a commercial CAD-oriented slide mobile phone, taking into account the influence of the SAM (specific anthropomorphic mannequin) head and hand, is presented. The simulation was performed using the commercial software SEMCAD, which is based on the Finite-Difference Time-Domain (FDTD) Method. The radiation effect on the SAM head and hand close to the phone was also investigated. Throughout the numerical simulations, the return loss, the radiation efficiency, and the near-field distribution of the mobile phone could be obtained, and thus the impact on the human body could be estimated. The slide phone was measured under different conditions. Numerical results were compared with the measurement data, and good agreement was obtained.
Keywords :
CAD; biological effects of radiation; cellular radio; finite difference time-domain analysis; mobile handsets; telecommunication computing; commercial CAD-oriented slide mobile phone; commercial software SEMCAD; finite-difference time-domain method; hand-head position; hearing aid compatibility; numerical simulation; radiation performance; specific anthropomorphic mannequin; Antenna measurements; Biological system modeling; Cellular phones; Computational modeling; Electromagnetic measurements; Facsimile; Finite difference methods; Humans; Interference; Land mobile radio cellular systems; Magnetic field measurement; Magnetic heads; Mobile handsets; Software performance; Solid modeling; FDTD methods; Specific Absorption Rate; biological effects of electromagnetic radiation; hearing aid compatibility; land mobile radio cellular systems; land mobile radio equipment;
Journal_Title :
Antennas and Propagation Magazine, IEEE
DOI :
10.1109/MAP.2010.5525613