DocumentCode :
1259665
Title :
Merged BiCMOS logic to extend the CMOS/BiCMOS performance crossover below 2.5-V supply
Author :
Ritts, Rosalyn B. ; Raje, Prasad A. ; Plummer, James D. ; Saraswat, Krishna C. ; Cham, Kit M.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
Volume :
26
Issue :
11
fYear :
1991
fDate :
11/1/1991 12:00:00 AM
Firstpage :
1606
Lastpage :
1614
Abstract :
The authors discuss the merged BiCMOS (MBiCMOS) gate, a unique circuit configuration to improve BiCMOS gate performance at low supply voltages. MBiCMOS maintains a measured delay and power-delay advantage over CMOS into the 2-V supply range, in a simple four-device gate that does not require any change in the standard BiCMOS processing sequence. In a 2-μm technology, MBiCMOS outperforms CMOS down to a 2.6-V supply. Gates designed for fabrication in a 0.5-μm technology and simulated using measured device parameters indicate that MBiCMOS can be used to extend the performance crossover voltage to below 2 V in the submicrometer regime. A full-swing version of the MBiCMOS gate (FS-MBiCMOS) is introduced. Simulations of 2-μm gates show FS-MBiCMOS/CMOS performance crossover voltages of 2.2 V
Keywords :
BIMOS integrated circuits; integrated logic circuits; logic gates; 0.5 micron; 2 micron; 2 to 2.6 V; four-device gate; full-swing version; low supply voltages; merged BiCMOS; performance crossover voltage; submicrometer regime; BiCMOS integrated circuits; CMOS logic circuits; CMOS process; CMOS technology; Delay; Inverters; Measurement standards; Merging; Power measurement; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.98979
Filename :
98979
Link To Document :
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