Title :
Invertible Exponential-Type Approximations for the Gaussian Probability Integral Q(x) with Applications
Author :
Olabiyi, Oluwatobi ; Annamalai, Annamalai
Author_Institution :
Dept. of Electr. & Comput. Eng., Prairie View A&M Univ., Prairie View, TX, USA
fDate :
10/1/2012 12:00:00 AM
Abstract :
In this article, we present very tight exponential-type approximations for the Gaussian probability integral Q(.) and/or the complementary error function erfc(.) which are subsequently used to devise the conditional symbol error probability (CEP) formulas for several classes of digital modulation schemes that are both invertible and in a "desirable" exponential form. These invertible CEP formulas are of interest in the optimization of discrete-rate adaptive modulation designs and for computation of the symbol/bit error outage performance metric. Our framework also facilitates the derivation of simple and tight closed-form approximation formulas for the average symbol error rate performance metric for a wide range of digital modulation schemes over generalized fading channels via the moment generating function approach. The accuracies of our new closed-form approximations have been validated with that of the exact expressions in an integral form.
Keywords :
Gaussian processes; adaptive modulation; approximation theory; error statistics; fading channels; Gaussian probability integral; average symbol error rate performance metric; closed-form approximation formulas; complementary error function; conditional symbol error probability; digital modulation schemes; discrete-rate adaptive modulation designs; generalized fading channels; invertible CEP formulas; invertible exponential-type approximations; moment generating function approach; symbol-bit error outage performance metric; Approximation methods; Bit error rate; Fading; Modulation; Optimization; Polynomials; Signal to noise ratio; Gauassian Q-function; adaptative modulation; bit error outage; moment generating function approach;
Journal_Title :
Wireless Communications Letters, IEEE
DOI :
10.1109/WCL.2012.080112.120232