Title :
Analysis of Residue Integration Sampling With Improved Jitter Immunity
Author :
Oh, Taehwan ; Maghari, Nima ; Gubbins, David ; Moon, Un-Ku
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
fDate :
7/1/2011 12:00:00 AM
Abstract :
The improved jitter immunity of window residue sampling (WRS) is analyzed in this brief. We build a mathematical model for WRS and compare the signal-to-noise ratio performance with the conventional impulse and integration sampling methods. Simulation results show that WRS has better jitter immunity of approximately 3 dB compared with conventional impulse sampling at the Nyquist input frequency.
Keywords :
analogue-digital conversion; jitter; sampling methods; ADC; Nyquist input frequency; WRS; integration sampling methods; jitter immunity; signal-to-noise ratio; window residue sampling; Analytical models; Clocks; Jitter; Mathematical model; Sampling methods; Signal to noise ratio; Simulation; Analog–digital conversion (ADC); charge sampling; impulse sampler; integration sampler; jitter; sampling methods;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2011.2158273
