DocumentCode :
1260146
Title :
A planar Bi-Sb multijunction thermal converter with small ac-dc transfer differences
Author :
Kim, Jin-Sup ; Lee, Hyun-Cheol ; Lee, Jong-Hyun ; Lee, Jung-Hee ; Park, Se Il ; Kwon, Sung-Won
Author_Institution :
Sch. of Electron. & Telecommun. Eng., Inje Univ., Kimhae, South Korea
Volume :
51
Issue :
1
fYear :
2002
fDate :
2/1/2002 12:00:00 AM
Firstpage :
115
Lastpage :
119
Abstract :
A planar Bi-Sb multijunction thermal converter was fabricated on the LPCVD Si3N4/SiO2/Si3N 4-diaphragm, prepared by silicon bulk micromachining, which thermally isolated a bifilar Pt- or NiCr-heater and the hot junctions of a Bi-Sb thermopile from the silicon substrate. The voltage responsivity, the ac-dc transfer difference, and the fluctuations of the output thermoelectric voltage and heater resistance were discussed to investigate the design factors of a thermal converter. The respective voltage responsivities in air and in a vacuum of the thermal converter with a built-in NiCr-heater were about 14.0 mV/mW and 54.0 mV/mW. The ac-dc voltage and the current transfer differences in air were about ±0.60 ppm and ±0.11 ppm in the dc reversing frequency range from 10 Hz to 10 kHz. They are sufficiently small to be used as practical ac standards. Compared to the thermal converter with a built-in Pt-heater, the thermal converter with a built-in NiCr-heater demonstrated a higher voltage responsivity and smaller ac-dc transfer differences, while exhibiting slightly larger fluctuations in output thermoelectric voltage and in heater resistance
Keywords :
antimony; bismuth; convertors; elemental semiconductors; measurement standards; silicon; silicon compounds; thermopiles; transducers; 10 Hz to 10 kHz; AC-DC difference; Bi-Sb thermopile; BiSb; FRDC; LPCVD; NiCr; NiCr-heater; Pt; Pt- NiCr-heater; Si; Si substrate; Si3N4-SiO2-Si3N4 ; Si3N4/SiO2/Si3N4 -diaphragm; fluctuations; output thermoelectric voltage; planar Bi-Sb multijunction thermal converter; thermal converter; thermoelectric voltage; voltage responsivity; Analog-digital conversion; Fluctuations; Heat transfer; Micromachining; Resistance heating; Silicon; Thermal factors; Thermal resistance; Thermoelectricity; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.989913
Filename :
989913
Link To Document :
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