• DocumentCode
    1260337
  • Title

    Layer selective magnetic moment distribution in an epitaxial double spin valve structure: Si[001]/Cu

  • Author

    Choi, B.C. ; Samad, A. ; Lee, W.Y. ; Langridge, S. ; Penfold, J. ; Bland, J.A.C.

  • Author_Institution
    Dept. of Phys., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • Firstpage
    3847
  • Lastpage
    3849
  • Abstract
    We determine layer selectively the magnetic moments, spin orientations and thicknessess oP an epitaxial double spin valve structure, Si(00l)/Cn/FeNi/Cu/Co/Cu/FeNi/Cu, using Polarised Neutron Reflectivity (PNR). At saturation, the layer-averaged magnetic moment per CO atom was Pound to be 1.71 ± 0.08 μ, while the top (bottom) FeNi layer moment was 1.08 ± 0.06 μB (0.95 ± 0.08 μB). For an applied field strength Ha smaller than the c0 layer coercive field of ~100 Oe, the CO and FeNi layer magnetisation vectors are Pound to lie in-plane but canted with respect to each other in contrast to the fully antiparallel state predicted by simple energy minimisation. The observed canting is discussed with regard to the role of magnetic domains in the CO layer.
  • Keywords
    canted spin arrangements; cobalt; coercive force; copper; elemental semiconductors; ferromagnetic materials; iron alloys; magnetic moments; magnetic multilayers; magnetisation; neutron diffraction; nickel alloys; silicon; spin valves; Cu-FeNi-Cu-Co-Cu-NiFe-Cu; FeNi layer moment; Si; antiparallel state; applied field strength; canting; coercive field; epitaxial double spin valve structure; layer selective magnetic moment distribution; layer-averaged magnetic moment; magnetic domains; magnetisation vectors; polarised neutron reflectivity; saturation; spin orientation; thickness; Giant magnetoresistance; Laboratories; Magnetic domains; Magnetic field measurement; Magnetic moments; Neutrons; Polarization; Reflectivity; Saturation magnetization; Spin valves;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800685
  • Filename
    800685