DocumentCode :
1260381
Title :
Magnetization reversal process of 360°-domain walls observed by magnetic force microscope in exchange-biased NiFe films
Author :
Cho, Hae Seok ; Fujiwara, Hideo
Author_Institution :
Centre for Mater. for Inf. Technol., Alabama Univ., Tuscaloosa, AL, USA
Volume :
35
Issue :
5
fYear :
1999
fDate :
9/1/1999 12:00:00 AM
Firstpage :
3868
Lastpage :
3870
Abstract :
The magnetization reversal process of an exchange biased NiFe layer was investigated around 360°-domain wall loops by magnetic force microscopy (MFM) in Glass/Ta(10 nm)/NiFe(7.2 nm)/FeMn(8.0 nm)/Ta(5 nm). The sample was prepared by rf-magnetron sputtering and characterized with vibrating sample magnetometer (VSM). The reversal process was performed dominantly by rotation due to a large unidirectional anisotropy and probably due to a substantial orientation deviation of the local pinning field from the easy axis of the NiFe-layer. The magnetization reversal process performed by wall nucleation and growth was also observed. The dominant reversal mechanism in the exchange-biased ferromagnetic layer was discussed in terms of anisotropy energy
Keywords :
exchange interactions (electron); ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic domain walls; magnetic force microscopy; magnetisation reversal; nickel alloys; spin valves; sputtered coatings; 360°-domain walls; NiFe; anisotropy energy; domain wall growth; exchange-biased NiFe films; exchange-biased ferromagnetic layer; large unidirectional anisotropy; local pinning field; magnetic force microscope; magnetization reversal process; orientation deviation; reversal process; rf-magnetron sputtering; wall nucleation; Anisotropic magnetoresistance; Atomic force microscopy; Magnetic domain walls; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetization reversal; Magnetometers; Sputtering;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.800691
Filename :
800691
Link To Document :
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