Title :
Easy axis orientation mapping and application to the development of MR films
Author :
Imagawa, Takao ; Tajima, Yasunari ; Mitsuoka, Katsuya
Author_Institution :
Data Storage & Retrieval Syst. Div., Hitachi Ltd., Kanagawa, Japan
fDate :
9/1/1999 12:00:00 AM
Abstract :
Easy axis orientation (EAO) measurement should be convenient way to characterize magnetic films for MR heads. However, the practical application was limited because of the complexity of EAO measurements. Here we clarify the EAO measurement condition by calculation and experiments. Then we show an example of EAO application to the development of MR films and identify an important parameter for wafer production
Keywords :
magnetic heads; magnetic thin films; magnetic variables measurement; magnetoresistive devices; MR films; MR heads; easy axis orientation mapping; easy axis orientation measurement; magnetic films; magnetoresistive films; magnetoresistive heads; measurement condition; wafer production; Coils; Kerr effect; Magnetic field measurement; Magnetic films; Magnetic heads; Magnetic switching; Magnetization; Production; Rotation measurement; Semiconductor device modeling;
Journal_Title :
Magnetics, IEEE Transactions on
