• DocumentCode
    1260563
  • Title

    Easy axis orientation mapping and application to the development of MR films

  • Author

    Imagawa, Takao ; Tajima, Yasunari ; Mitsuoka, Katsuya

  • Author_Institution
    Data Storage & Retrieval Syst. Div., Hitachi Ltd., Kanagawa, Japan
  • Volume
    35
  • Issue
    5
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    3949
  • Lastpage
    3951
  • Abstract
    Easy axis orientation (EAO) measurement should be convenient way to characterize magnetic films for MR heads. However, the practical application was limited because of the complexity of EAO measurements. Here we clarify the EAO measurement condition by calculation and experiments. Then we show an example of EAO application to the development of MR films and identify an important parameter for wafer production
  • Keywords
    magnetic heads; magnetic thin films; magnetic variables measurement; magnetoresistive devices; MR films; MR heads; easy axis orientation mapping; easy axis orientation measurement; magnetic films; magnetoresistive films; magnetoresistive heads; measurement condition; wafer production; Coils; Kerr effect; Magnetic field measurement; Magnetic films; Magnetic heads; Magnetic switching; Magnetization; Production; Rotation measurement; Semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.800718
  • Filename
    800718
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1260563