Title :
Accurate Analytical Model for Single Event (SE) Crosstalk
Author :
Liu, Baojun ; Cai, Li ; Zhu, Jing
Author_Institution :
Department of Electronic Science and Technology, Science Institute, Air Force Engineering University, Xi´´An, China
Abstract :
With advances in modern technology, circuits become more sensitive to single event transient (SET) due to decreased device feature size and increased coupling effects among interconnects, which might cause SET to affect multiple logic paths. This paper proposed an accurate and efficient SE crosstalk estimation model based on point admittance and equivalent circuit of SET. The proposed model uses a 6-node template circuit of interconnect and simplifies the calculation by use of point admittance. By use of Taylor series expansion theorem, the analytical expressions of noise peak voltage and pulse width are obtained. The waveform of SE crosstalk in the analytical model is very good in agreement with SPICE. Results from 1000 random cases show that by comparison with previous works, the model has a significant improved accuracy with an average error of only 3.07% in noise peak voltage, and 8.11% in pulse width, respectively. These results validate that the analytical model is efficient and accurate.
Keywords :
Admittance; Analytical models; Capacitance; Crosstalk; Equivalent circuits; Integrated circuit modeling; Noise; Analytical model; equivalent circuit; point admittance; single event crosstalk;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2204901